The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Apr. 14, 2011
Applicants:

Patrick Y. Hwang, Cedar Rapids, IA (US);

Gary A. Mcgraw, Cedar Rapids, IA (US);

Inventors:

Patrick Y. Hwang, Cedar Rapids, IA (US);

Gary A. McGraw, Cedar Rapids, IA (US);

Assignee:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); H04M 11/04 (2006.01); H04W 4/00 (2009.01);
U.S. Cl.
CPC ...
Abstract

A method for providing collaborative PNT for a plurality of nodes in a distributed sensing system is disclosed. The method may include receiving carrier phase and pseudorange measurements from a first node and a second node of the plurality of nodes; providing a process model for each node, where the process model for each node is configured for modeling error characteristics associated with that node; determining an error covariance between the first node and the second node; and estimating a PNT solution for the first node and a PNT solution for the second node based on: the carrier phase and pseudorange measurements received from the first node, the carrier phase and pseudorange measurements received from the second node, the process model for the first node, the process model for the second node, and the error covariance between the first node and the second node.


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