The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Nov. 18, 2013
Applicants:

BO LI, Beijing, CN;

Qizhi Xu, Beijing, CN;

Yue Tian, Beijing, CN;

Feng Gao, Beijing, CN;

Chen Zhong, Beijing, CN;

Inventors:

Bo Li, Beijing, CN;

Qizhi Xu, Beijing, CN;

Yue Tian, Beijing, CN;

Feng Gao, Beijing, CN;

Chen Zhong, Beijing, CN;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01);
Abstract

The present invention provides a panchromatic sharpening method of spectral image based on fusion of overall structural information and spatial detail information, comprising: performing brightness linear stretching on a panchromatic image, so as to set the variance of the panchromatic image to be equal to the variance of said spectral image; respectively interpolating N components of the spectral image so as to generate an interpolation image series having the same resolution as that of the panchromatic image; subtracting the interpolation image series from the panchromatic image after said linear stretching to obtain difference images; performing Gauss filtering on the difference images, thereby obtaining difference tendency images; and, respectively subtracting the difference tendency image series from the panchromatic image after said linear stretching, thus obtaining fused images. The method can maintain both spectral fidelity and texture detail fidelity of the fused images, support high computation speed, and has wide applicability.


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