The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Aug. 31, 2011
Applicant:

Makoto Iwayama, Tokorozawa, JP;

Inventor:

Makoto Iwayama, Tokorozawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01); G06K 9/72 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30696 (2013.01);
Abstract

Provided is a system for enumerating local alignments, comprising a local alignment enumeration module for enumerating local alignments, in a case where the cell of a second matrix corresponding to a cell at a transition source indicates that the cell belongs to a local alignment, and in a case where the maximum score calculated is larger than the predetermined value, registers, in the cell of the second matrix corresponding to the cell to be calculated, an identifier of a local alignment registered in the cell of the second matrix corresponding to the cell at the transition source, and further, in a case where the maximum score calculated is larger than a maximum score of the cells belonging to the same local alignment, stores the cell to be calculated as an end point of the local alignment.


Find Patent Forward Citations

Loading…