The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Nov. 16, 2012
Sensovation Ag, Radolfzell, DE;
Paul Hing, Owingen-Billafingen, DE;
Stefan Bickert, Uberlingen, DE;
Sensovation AG, Radolfzell, DE;
Abstract
The invention relates to a microscopy method for identifying target objects () having a predetermined optical property in material () to be analyzed. According to the invention, in a first step an overview field of view () of a microscope optical system () is directed to an overview region of a sample carrier () containing the material () to be analyzed, the material () to be analyzed is illuminated by an illumination unit (), which irradiates the sample carrier () from outside a field of view tube (), and is recorded by a camera (), the material () to be analyzed is optically analyzed for the optical property such that even a single target object () having the predetermined optical property is identified as such in the material () to be analyzed, in a subsequent second step a target field of view () of the microscope optical system () is aligned with a target region around the target object () using the known position of the target object (), and the identified target object () is analyzed in a differentiated manner for various additional optical properties.