The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Oct. 01, 2012
Chris Wagner, Ottawa, CA;
Eugene Chan, Kanata, CA;
Chris Wagner, Ottawa, CA;
Eugene Chan, Kanata, CA;
JDS Uniphase Corporation, Milpitas, CA (US);
Abstract
A source generates an optical test signal sweeping a bandwidth of wavelengths over time. The test signal is applied to a device under test (DUT) to generate a response signal. A timing signal generator connected to the source generates a timing signal having triggers at time instances corresponding to known wavelengths of the test signal. A DUT detector samples the DUT response signal generating sampled DUT data using a sampling period that is shorter than a shortest time between timing signal triggers. A correlator receives the timing signal, the known wavelengths associated with the timing signal triggers, the sampled DUT data and the DUT detector sampling period then correlates each sampled DUT datum to a wavelength of the test signal that was applied to the DUT when the DUT datum was sampled by interpolating the known wavelengths using the trigger time instances and the DUT detector sampling period.