The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Jun. 19, 2009
Applicants:

Stephen Brian Horowitz, Toney, AL (US);

Mark Sheplak, Gainesville, FL (US);

Toshikazu Nishida, Gainesville, FL (US);

Louis Nicholas Cattafesta, Iii, Gainesville, FL (US);

Inventors:

Stephen Brian Horowitz, Toney, AL (US);

Mark Sheplak, Gainesville, FL (US);

Toshikazu Nishida, Gainesville, FL (US);

Louis Nicholas Cattafesta, III, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G02B 1/02 (2006.01); G01N 13/02 (2006.01); G02B 27/60 (2006.01);
U.S. Cl.
CPC ...
G01N 13/02 (2013.01); G02B 1/02 (2013.01); G01N 2013/0216 (2013.01); G02B 27/60 (2013.01);
Abstract

A shear-stress sensing system can include a floating element whose displacement can be detected through use of optical measurements. The system can utilize high temperature materials to deliver the optical signal to the structure to be measured, which can also utilize high temperature materials. In one embodiment, an intensity modulation or phase modulation of a reflected signal can be measured to determine the shear stress. In another embodiment, a Moire fringe pattern can be used to determine the shear stress.


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