The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Apr. 19, 2011
Takeshi Nakayama, Hyogo, JP;
Yoshiyuki Saito, Osaka, JP;
Masahiro Ishii, Hyogo, JP;
Kouichi Ishino, Osaka, JP;
Yukihiro Ishimaru, Osaka, JP;
Takeshi Nakayama, Hyogo, JP;
Yoshiyuki Saito, Osaka, JP;
Masahiro Ishii, Hyogo, JP;
Kouichi Ishino, Osaka, JP;
Yukihiro Ishimaru, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An IC current measuring apparatus is provided between an IC and a substrate. The IC current measuring apparatus electrically connects each of a plurality of IC-facing terminals and a different one of a plurality of substrate-facing terminals. Especially, resistances are each inserted into a path between an IC terminal targeted for measurement and a substrate terminal corresponding thereto. Furthermore, the IC current measuring apparatus is provided with terminals each used to measure a voltage between both ends of an inserted resistance corresponding thereto. Accordingly, a measurer who measures current flowing through an IC-facing terminal can measure the current flowing through the IC-facing terminal by providing the IC current measuring apparatus between the IC targeted for measurement and the substrate and measuring a voltage between both ends of an inserted resistance corresponding to the IC terminal through which current he/she wishes to measure flows.