The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Jan. 18, 2013
Applicant:

Joseph C. Robinson, Portland, OR (US);

Inventor:

Joseph C. Robinson, Portland, OR (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/10 (2006.01); B23K 15/00 (2006.01); H01J 37/26 (2006.01); G01Q 60/24 (2010.01); G01Q 30/20 (2010.01); G02B 21/26 (2006.01); H01J 37/20 (2006.01); B82Y 35/00 (2011.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
B23K 15/0006 (2013.01); H01J 37/261 (2013.01); G01Q 60/24 (2013.01); G01Q 30/20 (2013.01); G02B 21/26 (2013.01); H01J 37/20 (2013.01); B82Y 35/00 (2013.01); H01J 2237/2809 (2013.01); H01J 2237/31745 (2013.01); G01N 2001/2886 (2013.01);
Abstract

Systems and methods for preparing solid samples for analysis, such as microscopic examination in cross section or planimetric orientation. The sample preparation systems may include a sample support configured to secure a solid sample, an excitation beam source that generates an excitation beam configured to remove material from a surface of the sample, a beam shield configured to at least partially protect the sample from the excitation beam, and a beam shield holder configured to secure the beam shield, where the adjustment of the relative positions of the beam shield and sample holder permits the excitation beam to selectively expose a series of substantially planar surfaces of the sample.


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