The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Oct. 09, 2009
Jiulin Xia, Germantown, MD (US);
Richard L. Mantefuel, Laytonsville, MD (US);
Carl Theodore Edens, Highland, MD (US);
Jonathan Matthew Miller, Burke, VA (US);
Nadia P. Allen, Montgomery Village, MD (US);
Jiulin Xia, Germantown, MD (US);
Richard L. Mantefuel, Laytonsville, MD (US);
Carl Theodore Edens, Highland, MD (US);
Jonathan Matthew Miller, Burke, VA (US);
Nadia P. Allen, Montgomery Village, MD (US);
Qiagen Gaithersburg, Inc., Gaithersburg, MD (US);
Abstract
An automated method for assuring sample adequacy. The method includes providing a sample in a testing container, activating an illumination source to pass an illumination beam through the testing container and into the sample, and detecting an intensity of an emitted beam. The emitted beam includes at least a portion of the illumination beam that has been scattered by the sample. The method also includes generating a sample turbidity measurement based on the intensity of the emitted beam, and determining, based on the sample turbidity measurement, an adequacy of the sample to provide accurate results in a primary test.