The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Jul. 02, 2010
Edwin Jay Sarver, Carbondale, IL (US);
Thomas D. Padrick, Seattle, WA (US);
Max Hall, Corona, CA (US);
Edwin Jay Sarver, Carbondale, IL (US);
Thomas D. Padrick, Seattle, WA (US);
Max Hall, Corona, CA (US);
Wavetec Vision Systems, Inc., Aliso Viejo, CA (US);
Abstract
A system and method for determining an objective quality metric for image data collected by a wavefront aberrometer. The method may include quantifying a plurality of characteristics of the image data and calculating the objective quality metric based on the quantified characteristics of the image data. The objective quality metric can be a weighted sum of the quantified characteristics of the image data. The weightings for the weighted sum can be determined based on subjective quality metrics assigned to a set of training image data by a human expert.