The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Mar. 26, 2012
Applicants:
Leonid C. Lev, West Bloomfield, MI (US);
Randy Gu, Rochester Hills, MI (US);
Lianxiang Yang, Rochester Hills, MI (US);
Nan Xu, Auburn Hills, MI (US);
Inventors:
Leonid C. Lev, West Bloomfield, MI (US);
Randy Gu, Rochester Hills, MI (US);
Lianxiang Yang, Rochester Hills, MI (US);
Nan Xu, Auburn Hills, MI (US);
Assignee:
GM Global Technology Operations LLC, Detroit, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for detecting the integrity of a bond of a multi-piece work piece includes capturing a first image of the work piece, stressing the work piece, capturing a stressed image of the work piece, and comparing the first image of the work piece with the stressed image of the work piece to determine the integrity of the bond.