The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Aug. 09, 2012
Applicants:
Jens Hofrichter, Gattikon, CH;
Felix Holzner, Zurich, CH;
Folkert Horst, Wettingen, CH;
Philip Paul, Zurich, CH;
Inventors:
Jens Hofrichter, Gattikon, CH;
Felix Holzner, Zurich, CH;
Folkert Horst, Wettingen, CH;
Philip Paul, Zurich, CH;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 20/00 (2010.01); G01Q 60/38 (2010.01); G01Q 70/02 (2010.01); G01Q 60/24 (2010.01); G01Q 20/04 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/02 (2013.01); G01Q 60/38 (2013.01); G01Q 70/02 (2013.01); G01Q 60/24 (2013.01); G01Q 20/00 (2013.01); G01Q 20/04 (2013.01);
Abstract
An apparatus and method directed to a scanning probe microscopy cantilever. The apparatus includes body and an electromagnetic sensor having a detectable electromagnetic property varying upon deformation of the body. The method includes scanning the surface of a material with the cantilever, such that the body of the cantilever undergoes deformations and detecting the electromagnetic property varying upon deformation of the body of the cantilever.