The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Apr. 23, 2013
Infineon Technologies Ag, Neubiberg, DE;
Holger Busch, Brunnthal, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
A method for formal fault detection in a design model includes providing a plurality of faults which are individually activatable in the design model, and providing a plurality of properties for the design model wherein each property of the plurality of properties is valid if none of the plurality of faults is activated. The method further includes selecting a property of the plurality of properties, and determining, by a formal property checker, whether activation of one fault of the plurality of faults causes the selected property to fail. If the formal property checker finds a particular fault which, when activated, causes the selected property to fail, determining that the selected property is capable to detect the particular fault, and if the formal property checker does not find any particular fault which, when activated, causes the selected property to fail, determining that the selected property is not capable to detect any fault of the plurality of faults.