The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Dec. 16, 2011
Applicant:

Kentarou Yabuki, Tokyo, JP;

Inventor:

Kentarou Yabuki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A candidate to cause a fault is identified, in case that correlation destruction is detected in some processing apparatuses or the like due to spread of the fault within a system. A correlation destruction detecting unitdetects correlation destruction related to a correlation which is included in a correlation modelby applying inputted performance value of a monitored object to the correlation modelof the monitored object which a correlation model storing unitstores. The fault analyzing unitdetermines and outputs the monitored object which should be a candidate to cause a fault through comparing results of judging whether detecting or not detecting the correlation destruction related to a common correlation in a plurality of the monitored objects which are connected directly or indirectly with a common apparatus or common the monitored object and which have the correlation modelsincluding the common correlation.


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