The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Dec. 03, 2012
Applicant:

Taiwan Memory Qualification Center Corporation, Taipei, TW;

Inventors:

Jack Tseng, Taipei, TW;

David S. Lin, Taipei, TW;

Shao-Kuei Wu, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 29/08 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/006 (2013.01); H04L 29/08 (2013.01); G06F 11/22 (2013.01);
Abstract

In a method and system for cloud testing and remote monitoring of an IC component during validation of a computerized system connected to a cloud server via a wide area network, upon determining that a unique system code of a system platform and a unique component code of the IC component transmitted from the computerized system in response to execution of an identification operating system (OS) program and a driver from the cloud server match identification data, the cloud server transmits a corresponding test OS and a corresponding test program to the computerized system such that the computerized system produces test data corresponding to the corresponding test program in response to execution of the corresponding test OS and test program.


Find Patent Forward Citations

Loading…