The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Apr. 30, 2007
Applicants:

Brian L. Patterson, Boise, ID (US);

Michael B. Jacobson, Boise, ID (US);

Ronald D. Rodriguez, Boise, ID (US);

Inventors:

Brian L. Patterson, Boise, ID (US);

Michael B. Jacobson, Boise, ID (US);

Ronald D. Rodriguez, Boise, ID (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 11/14 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0665 (2013.01); G06F 11/201 (2013.01); G06F 11/2092 (2013.01); G06F 11/1451 (2013.01); G06F 11/1464 (2013.01); G06F 3/067 (2013.01); G06F 3/0617 (2013.01); G06F 3/064 (2013.01);
Abstract

Embodiments of the present invention include array-cluster systems, and methods employed in array-cluster systems, that allow snapshot data to be distributed over multiple arrays within an array cluster. By distributing snapshot data over multiple arrays within an array cluster, the load, generally related to the number of access operations directed to the arrays within an array cluster, may be more evenly distributed among the arrays of an array cluster, preventing increased latencies associated with overloading individual arrays Distributed snapshots may also facilitate high availability and fault tolerance within an array cluster.


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