The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
May. 23, 2011
Xun Zhang, Westford, MA (US);
Mark D. Thornley, Fort Collins, CA (US);
Viswanath Annampedu, Schnecksville, PA (US);
Peter J. Windler, Fort Collins, CO (US);
Xun Zhang, Westford, MA (US);
Mark D. Thornley, Fort Collins, CA (US);
Viswanath Annampedu, Schnecksville, PA (US);
Peter J. Windler, Fort Collins, CO (US);
LSI Corporation, San Jose, CA (US);
Abstract
Various embodiments of the present invention provide systems and methods related to pattern detection. As an example, a system for sample selection is disclosed that includes a difference calculation circuit, a comparator circuit, and an output selector circuit. The difference calculation circuit is operable to calculate a first difference between a first value corresponding to a first digital sample and a second value corresponding to a second digital sample, and to calculate a second difference between a third value corresponding to a third digital sample and a fourth value corresponding to a fourth digital sample. The comparator circuit is operable to compare the first difference with the second difference to yield a comparison output. The output selector circuit is operable to select one of the second value and the fourth value as an output based at least upon the comparison output.