The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Jun. 12, 2012
Applicants:

Aydogan Ozcan, Boston, MA (US);

Michel J. F. Digonnet, Palo Alto, CA (US);

Gordon S. Kino, Stanford, CA (US);

Inventors:

Aydogan Ozcan, Boston, MA (US);

Michel J. F. Digonnet, Palo Alto, CA (US);

Gordon S. Kino, Stanford, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/00 (2006.01); G01B 9/02 (2006.01); A61B 5/00 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0066 (2013.01); G01B 9/02091 (2013.01); G01B 9/02083 (2013.01); G01B 9/02044 (2013.01); A61B 5/0073 (2013.01); A61B 5/7257 (2013.01); G01N 21/4795 (2013.01);
Abstract

An apparatus and method process optical coherence tomography (OCT) imaging data from a sample. The method includes using a magnitude spectrum and an estimated phase term of a complex spatial Fourier transform of a complex intermediate function to generate an estimated complex spatial Fourier transform. The method further includes calculating an inverse Fourier transform of the estimated complex spatial Fourier transform and calculating an estimated intermediate function by applying at least one constraint to the inverse Fourier transform. The apparatus includes a partially reflective element configured to reflect a first portion of light and to allow a second portion of light to propagate through the partially reflective element and to reflect from the sample. The apparatus further includes a detector that measures the OCT power spectrum in response to the first and second portions of light.


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