The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Jan. 14, 2011
Tamir E. Moran, Petaluma, CA (US);
Jatinderjit S. Bains, Santa Rosa, CA (US);
Daniel S. Wertz, Sebastopol, CA (US);
Tamir E. Moran, Petaluma, CA (US);
Jatinderjit S. Bains, Santa Rosa, CA (US);
Daniel S. Wertz, Sebastopol, CA (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A user obtains a set of modules, inserts them into slots of a chassis, and interconnects the modules to form a modular instrument. A signal path extends through the modules. To support calibration of the signal path, a first of the modules (or the chassis or a calibration module) includes a calibration signal generator. A computer directs the first module to apply the calibration signal from the generator to the signal path, and measures the power (or amplitude) of the output of the signal path. The computer reads a factory-measured value A of the calibration signal amplitude from a memory of the first module (or the chassis or the calibration module). The value A and the measured output power of the signal path are used to determine a gain of the signal path. The system compensates for that gain when the signal path is used to measure live operational signals.