The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Nov. 18, 2009
Applicants:
Hendricus Joseph Maria Veendrick, Heeze, NL;
Marcel Pelgrom, Helmond, NL;
Victor Zieren, Valkenswaard, NL;
Inventors:
Hendricus Joseph Maria Veendrick, Heeze, NL;
Marcel Pelgrom, Helmond, NL;
Victor Zieren, Valkenswaard, NL;
Assignee:
NXP, B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 29/26 (2006.01); G05D 3/12 (2006.01); G01R 19/165 (2006.01); G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3004 (2013.01); G01R 19/16552 (2013.01); G01R 19/16571 (2013.01);
Abstract
Apparatus and method for IR-drop and supply noise measurements in electronic circuits. A first voltage at a point of interest in the circuit is sampled and stored during a quiescent mode of the circuit the voltage is to be measured in. Subsequently, the circuit is brought in an operating mode and a second voltage is sampled and held at the same point of interest. The first and the second voltage are compared and a corresponding voltage signal is passed to a system output.