The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Jun. 05, 2009
Matthew A. Taylor, Weare, NH (US);
Matthew A. Taylor, Weare, NH (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
Techniques are disclosed for computing distance-to-fault (DTF) in communication systems. The techniques can be embodied, for instance, in a DTF system that provides a multi-port probing device and DTF functionality, including computing distances to faults and the fault magnitudes. In addition, the DTF system is further configured with the ability to accurately measure complex reflection coefficient of the UUT, and/or return loss of the UUT. The complex reflection coefficient and/or return loss of the UUT can be computed as a function of known scattering parameters of a multi-port measurement circuit included in the probe of the DTF system.