The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Mar. 23, 2011
David Langley Rick, Longmont, CO (US);
David Langley Rick, Longmont, CO (US);
Hach Company, Loveland, CO (US);
Abstract
An instrument () is provided according to an embodiment of the invention. The instrument () includes an interface () configured to receive a Doppler measurement signal and a processing system () coupled to the interface () and receiving the Doppler measurement signal. The processing system () is configured to generate a two-sided velocity spectrum including a plurality of discrete frequency bins from the Doppler measurement signal, with the two-sided velocity spectrum distinguishing spectral elements, and process one or more velocity spectrum bin pairs against a plurality of local gate thresholds, with the one or more velocity spectrum bin pairs being substantially symmetrically located about one or more carrier wave bins and wherein each velocity spectrum bin pair is processed against a corresponding local gate threshold of the plurality of local gate thresholds.