The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Jul. 25, 2011
Applicants:

Amiad Dvir, Nes-Ziona, IL;

Eli Elmoalem, Nili, IL;

Inventors:

Amiad Dvir, Nes-Ziona, IL;

Eli Elmoalem, Nili, IL;

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/00 (2006.01); H04J 3/16 (2006.01); H04B 10/077 (2013.01); H04J 3/14 (2006.01); H04Q 11/00 (2006.01); H04J 3/06 (2006.01);
U.S. Cl.
CPC ...
H04J 3/14 (2013.01); H04Q 2011/0015 (2013.01); H04J 3/0682 (2013.01); H04J 3/1694 (2013.01); H04B 10/0771 (2013.01); H04Q 2011/0035 (2013.01); H04Q 11/0067 (2013.01); H04Q 2011/0083 (2013.01); H04J 2203/006 (2013.01); H04Q 2011/0081 (2013.01);
Abstract

A method for detecting faults and their locations in an optical path between an optical line terminal (OLT) of and optical network units (ONUs) of a passive optical network (PON). The method comprises forming a maintenance optical link through the PON between the OLT and a collocated ONU, the OLT and its collocated ONU are each connected to an optical splitter; sending a ranging request from the OLT to the collocated ONU; in response to the ranging request, receiving, over the maintenance optical line, a ranging burst signal including at least a fault analysis detection pattern (FADP); and analyzing the FADP in the received signal by auto-correlating the FADP signal with an expected FADP signal, an uncorrelated event measured through the auto-correlation is indicative of a fault in the optical path of the PON and occurrence times of such events are indicative of the fault's location in the optical path.


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