The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Nov. 21, 2012
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/6232 (2013.01);
Abstract
Systems and methods for metric learning include iteratively determining feature groups of images based on its derivative norm. Corresponding metrics of the feature groups are learned by gradient descent based on an expected loss. The corresponding metrics are combined to provide an intermediate metric matrix as a sparse representation of the images. A loss function of all metric parameters corresponding to features of the intermediate metric matrix are optimized, using a processor, to learn a final metric matrix. Eigenvalues of the final metric matrix are projected onto a simplex.