The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

May. 01, 2013
Applicant:

Samsung Electronics Co., Ltd, Suwon-si, KR;

Inventors:

Lup Meng Loh, Plano, TX (US);

John Alex Interrante, Richardson, TX (US);

William Hurley, Murphy, TX (US);

Yaming Zhang, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/49 (2006.01); H04L 27/00 (2006.01); H04L 25/08 (2006.01);
U.S. Cl.
CPC ...
H04L 25/08 (2013.01);
Abstract

An apparatus for envelope tracking calibration for use in a wireless communication is provided. The apparatus includes a transmission signal path configured to carry a transmission signal to an antenna. An envelope signal path configured to feed an envelope signal with an envelope tracking power amplifier. A controller is configured to transmit a normal envelope signal being generated in a normal operation mode and measure a first Adjacent Channel Leakage Ratio (ACLR) corresponding to the normal envelope signal. The controller is further configured to transmit a comparison envelope signal being generated in a comparison operation mode and measure a second ACLR corresponding to the comparison envelope signal. The controller is configured to calculate a time misalignment between the transmission signal path and the envelope signal path based on a difference between the first and second ACLRs.


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