The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Feb. 24, 2014
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Koki Mie, Fukuoka, JP;

Katsuhiko Yamatsu, Fukuoka, JP;

Yuji Higashihara, Fukuoka, JP;

Masahiro Hayashi, Fukuoka, JP;

Yuichi Inao, Fukuoka, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0847 (2013.01);
Abstract

Anode device includes a transmitter and a processor. The transmitter transmits an inspection frame used in inspecting a status of a route from a source node device to a destination node device. The processor generates a first inspection frame and selects a first node device to which the transmitter transmits the first inspection frame from among candidates for a node device to which a frame addressed to the destination node device is to be forwarded. The processor judges whether a transmission of the first inspection frame has been successfully performed. When the transmission of the first inspection frame has failed, the processor generates a second inspection frame which records a failure in a communication with the first node device. The processor selects a second node device to which the transmitter transmits the second inspection frame from among the candidates.


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