The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Sep. 10, 2012
Kwang Soo Kim, Suwon-si, KR;
Chang Hoon Choi, Suwon-si, KR;
IN Ho Seo, Daejeon, KR;
Hyun Jae Lee, Suwon-si, KR;
Myoung Ki Ahn, Cheonan-si, KR;
Byeong Hwan Jeon, Yongin-si, KR;
Sung Jin Lee, Seongnam-si, KR;
Kwang Soo Kim, Suwon-si, KR;
Chang Hoon Choi, Suwon-si, KR;
In Ho Seo, Daejeon, KR;
Hyun Jae Lee, Suwon-si, KR;
Myoung Ki Ahn, Cheonan-si, KR;
Byeong Hwan Jeon, Yongin-si, KR;
Sung Jin Lee, Seongnam-si, KR;
Abstract
A focusing device for an optical microscope may include a light emitting unit configured to emit laser light having a specific wavelength, a wedge mirror configured to enable the emitted laser light to be incident on a plurality of locations of a surface of a specimen, first and second light receiving units configured to detect an amount of laser light reflected from the surface of the specimen, a spatial filter configured to eliminate out-of-focus light from light beams reflected from the surface of the specimen and to detect an amount of in-focus light, and a control unit configured to generate a control signal used to carry out focus adjustment of the optical microscope using a plurality of light-amount information detected by the first and second light receiving units and the spatial filter.