The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Feb. 04, 2011
YE Yang, Worcester, MA (US);
Babs R. Soller, Northboro, MA (US);
Olusola O. Soyemi, Shrewsbury, MA (US);
Michael A. Shear, Northbridge, MA (US);
Ye Yang, Worcester, MA (US);
Babs R. Soller, Northboro, MA (US);
Olusola O. Soyemi, Shrewsbury, MA (US);
Michael A. Shear, Northbridge, MA (US);
University of Massachusetts, Boston, MA (US);
Abstract
We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.