The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Mar. 28, 2013
Wistron Corporation, New Taipei, TW;
Po-Liang Huang, New Taipei, TW;
Yu-Yen Chen, New Taipei, TW;
Lin-Husng Chang, New Taipei, TW;
Chia-Jui Liu, New Taipei, TW;
Kai-Chung Cheng, New Taipei, TW;
Wistron Corporation, New Taipei, TW;
Abstract
A testing device, a detection system, and an automatic detection method thereof are disclosed. The detection system is used for testing an optical capturing module and includes a controlling module and the testing device. The controlling module is electrically connected to the optical capturing module. The testing device includes a base, a fixing unit, a testing unit and a track. The fixing unit is disposed on the base and used for mounting the optical capturing module. The testing unit is used for the optical capturing module to capture a sensing signal. The track is disposed on the base for the testing unit to move along the track. When the testing unit is moving, the optical capturing module is use for capturing a sensing signal curve according to the continuous movement of the test element and the control module determines whether the sensing signal curve is exceed a predetermined value.