The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Apr. 13, 2011
Norikazu Sugiyama, Hamamatsu, JP;
Takuji Kataoka, Hamamatsu, JP;
Takahiro Ikeda, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A cell observation device is provided with a reflection interference shutterA which adjusts a light quantity of light emitted from a reflection interference measurement light source, a quantitative phase shutterA which adjusts a light quantity of light emitted from a quantitative phase measurement light source, a camerawhich images reflected light from the reflection interference measurement light sourceto generate a reflection interference image and which images transmitted light from a quantitative phase measurement light sourceto generate a quantitative phase image, and a first extraction unitand a second extraction unitwhich extract first and second parameters from the reflection interference image generated by the camera. During generation of the reflection interference image, the quantitative phase shutterA blocks the light from the quantitative phase measurement light source. During generation of the quantitative phase image, the reflection interference shutterA blocks the light from the reflection interference measurement light source