The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Nov. 05, 2010
Todd D. Liberty, Apple Valley, MN (US);
Timothy A. Skunes, Mahtomedi, MN (US);
Carl E. Haugan, St. Paul, MN (US);
Chuanqi Chen, Singapore, SG;
Beverly Caruso, St. Louis Park, MN (US);
Steven K. Case, St. Louis Park, MN (US);
Todd D. Liberty, Apple Valley, MN (US);
Timothy A. Skunes, Mahtomedi, MN (US);
Carl E. Haugan, St. Paul, MN (US);
Chuanqi Chen, Singapore, SG;
CyberOptics Corporation, Golden Valley, MN (US);
Abstract
An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.