The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Apr. 09, 2010
Applicant:
Hiroaki Inoue, Tokyo, JP;
Inventor:
Hiroaki Inoue, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/3187 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3187 (2013.01); G01R 31/3172 (2013.01);
Abstract
This invention has an object of providing a semiconductor integrated circuit enabling further reduction of the number of test terminals without depending on a compression/expansion technique alone. The semiconductor integrated circuit of the invention is connected to a terminal group used to exchange test information of a circuit to be tested, and comprises a utilization device which utilizes, when reading a test result, a terminal subgroup of the terminal group, which is not used to transmit information required to read the test result, to receive the test result from the circuit to be tested.