The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Mar. 14, 2012
Applicants:

Taek Lim, Erzhausen, DE;

Rolf Aidam, Wyhl, DE;

Lutz Kirste, Freiburg, DE;

Ruediger Quay, Freiburg, DE;

Inventors:

Taek Lim, Erzhausen, DE;

Rolf Aidam, Wyhl, DE;

Lutz Kirste, Freiburg, DE;

Ruediger Quay, Freiburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/338 (2006.01); H01L 29/778 (2006.01); H01L 27/06 (2006.01);
U.S. Cl.
CPC ...
H01L 29/778 (2013.01); H01L 27/0605 (2013.01);
Abstract

A semiconductor structure includes a barrier layer, a spacer structure, and a channel layer. The barrier layer includes a group III nitride. The spacer structure includes first and second aluminum nitride layers and an intermediate layer. The intermediate layer includes a group III nitride and is between the first and second aluminum nitride layers. The intermediate layer has a first free charge carrier density at an interface with the second aluminum nitride layer. The spacer structure is between the barrier layer and the channel layer. The channel layer includes a group III nitride and has a second free charge carrier density at an interface with the first aluminum nitride layer of the spacer structure. The first aluminum nitride layer, the intermediate layer, and the second aluminum nitride layer have layer thicknesses so the first free charge carrier density is less than 10% of the second free charge carrier density.


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