The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Sep. 08, 2004
Applicants:

Yuichiro Shindo, Ibaraki, JP;

Yasuhiro Yamakoshi, Ibaraki, JP;

Inventors:

Yuichiro Shindo, Ibaraki, JP;

Yasuhiro Yamakoshi, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 19/03 (2006.01); C23C 14/34 (2006.01);
U.S. Cl.
CPC ...
C23C 14/3414 (2013.01); C22C 19/03 (2013.01);
Abstract

Provided are a high purity Ni—V alloy, high purity Ni—V alloy target and high purity Ni—V alloy thin film wherein the purity of the Ni—V alloy excluding Ni, V and gas components is 99.9 wt % or higher, and the V content variation among ingots, targets or thin films is within 0.4%. With these high purity Ni—V alloy, high purity Ni—V alloy target and high purity Ni—V alloy thin film having a purity of 99.9 wt % or higher, the variation among ingots, targets or thin films is small, the etching property is improved, and isotopic elements such as U and Th that emit alpha particles having an adverse effect on microcircuits in a semiconductor device are reduced rigorously. And further provided is a manufacturing method of such high purity Ni—V alloy capable of effectively reducing the foregoing impurities.


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