The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Jun. 19, 2011
Ariel Birnbaum, Kiryat Motzkin, IL;
Rachel Tzoref-brill, Haifa, IL;
Steven Mittermaier, New York, NY (US);
Itai Erwin Segall, Tel-Aviv, IL;
Avi Ziv, Haifa, IL;
Ariel Birnbaum, Kiryat Motzkin, IL;
Rachel Tzoref-Brill, Haifa, IL;
Steven Mittermaier, New York, NY (US);
Itai Erwin Segall, Tel-Aviv, IL;
Avi Ziv, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems and methods for modeling test space for verifying system behavior, using one or more auxiliary variables, are provided. The method comprises implementing a functional coverage model including: one or more attributes, wherein respective values for the attributes are assigned according to a test plan, and one or more constraints defining restrictions on value combinations assigned to the attributes, wherein the restrictions are Boolean expressions defining whether said value combinations are valid; determining a set of valid value combinations for the attributes that satisfy the restrictions to define the test space for verifying the system behavior; and determining relevant auxiliary variables and a corresponding function for said auxiliary variables to reduce the complexity associated with modeling the test space.