The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Aug. 01, 2012
Applicants:
Henry Leung, Alberta, CA;
Siyue Chen, Alberta, CA;
Inventors:
Henry Leung, Alberta, CA;
Siyue Chen, Alberta, CA;
Assignee:
Empire Technology Development LLC, Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 11/30 (2006.01); G06F 11/08 (2006.01); G06N 99/00 (2010.01); G06F 9/46 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 11/30 (2013.01); G06F 11/08 (2013.01); G06F 9/46 (2013.01);
Abstract
Technologies are presented for anomaly detection in a cloud environment using a sparsity measure. In some examples, cloud metric data may be gathered and processed into a dictionary base. Linear transform coefficients for a test sample may then be calculated from the dictionary base using l-norm minimization. A sparsity measure may then be computed from the linear transform coefficients. If the sparsity measure does not exceed a predefined threshold, the test sample may be determined as anomalous.