The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Sep. 22, 2011
Naoki Shindo, Akashi, JP;
Yusuke Suga, Kobe, JP;
Aya Konishi, Nishinomiya, JP;
Daigo Fukuma, Kobe, JP;
Keisuke Kuwano, Kobe, JP;
Naoki Shindo, Akashi, JP;
Yusuke Suga, Kobe, JP;
Aya Konishi, Nishinomiya, JP;
Daigo Fukuma, Kobe, JP;
Keisuke Kuwano, Kobe, JP;
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Abstract
The present invention is a sample analyzing system, including a sample analyzer and a management apparatus connected to the sample analyzer via a communication network. The management apparatus includes: a first memory that stores a computer program for the sample analyzer and manual data which corresponds to a version of the computer program; a first communication device; and a first controller configured to transmit, via the first communication device to the sample analyzer, the computer program and the manual data corresponding to the version of the computer program stored in the first memory. The sample analyzer includes: a second communication device; a second memory that stores the computer program and the manual data received by the second communication device; and a second controller configured to execute the computer program stored in the second memory.