The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Jan. 22, 2014
Applicant:
International Electronic Machines Corporation, Troy, NY (US);
Inventors:
Zahid F. Mian, Loudonville, NY (US);
Robert W. Foss, Cohoes, NY (US);
Assignee:
International Electronics Machines Corp., Troy, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/10 (2006.01); G07C 5/00 (2006.01); G06K 9/46 (2006.01); G01M 17/007 (2006.01); G01M 17/013 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G07C 5/00 (2013.01); G06K 9/4604 (2013.01); G01M 17/007 (2013.01); G01M 17/013 (2013.01); G01N 21/88 (2013.01);
Abstract
A solution for evaluating an object using infrared data is provided. In particular, infrared data corresponding to the object is processed to enhance a set of signal features. The infrared data is analyzed to determine whether one or more anomalies are present.
Mian, Zahid. (2014). Infrared data-based object evaluation (U.S. Patent No. 8868291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8868291
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile