The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8868159 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 21, 2014

Filed:

Mar. 30, 2011
Applicant:

Yuuji Onimura, Fujinomiya, JP;

Inventor:

Yuuji Onimura, Fujinomiya, JP;

Assignee:

Terumo Kabushiki Kaisha, Shibuya-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 5/02 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/6852 (2013.01); A61B 5/02007 (2013.01); A61B 5/0066 (2013.01);
Abstract

An optical imaging diagnostic apparatus including: a designating unit for designating a predetermined circumferential-direction position at the circumference of the transmitting and receiving unit on the cross-sectional image displayed; an extraction unit for extracting, within the plurality of line data used for the generation of the cross-sectional image, line data corresponding to circumferential-direction position designated in the designating unit from the storage unit; a calculation unit for calculating attenuation rate in a predetermined region in a radial direction of a body lumen with respect to the extracted line data; and a display unit for displaying the calculated attenuation rate.


Find Patent Forward Citations

Onimura, Yuuji. (2014). Optical imaging diagnostic apparatus and the display control method thereof (U.S. Patent No. 8868159). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8868159

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…