The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Jun. 13, 2012
Hideo Muroi, Kanagawa, JP;
Yushi Hirayama, Kanagawa, JP;
Shuji Hirai, Tokyo, JP;
Hitoshi Ishibashi, Kanagawa, JP;
Hideo Muroi, Kanagawa, JP;
Yushi Hirayama, Kanagawa, JP;
Shuji Hirai, Tokyo, JP;
Hitoshi Ishibashi, Kanagawa, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
In an embodiment, a diffuse reflection output conversion method is executed in an apparatus detecting a plurality of gradation patterns. The apparatus includes a light emitter and light receiver, and detects specular reflection and diffuse reflection simultaneously. A region before specular reflection saturation is a region where the specular reflection component decreases and saturates at minimum level. A diffuse reflection detector is calibrated by: obtaining a diffuse reflection output resulting from an amount of attached powder at a border between the region before specular reflection saturation and the region after specular reflection saturation; calculating a ratio between the diffuse reflection output and a reference diffuse reflection output calculated in advance as a calibration coefficient; and multiplying a diffuse reflection output obtained from the gradation patterns by the calibration coefficient calculated at the calculating.