The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Apr. 20, 2011
Eric J. Seibel, Seattle, WA (US);
Qin Miao, Seattle, WA (US);
Ryan Lee Coe, Seattle, WA (US);
Per G. Reinhall, Seattle, WA (US);
Eric J. Seibel, Seattle, WA (US);
Qin Miao, Seattle, WA (US);
Ryan Lee Coe, Seattle, WA (US);
Per G. Reinhall, Seattle, WA (US);
Other;
Abstract
Claimed is an imaging and diagnostic system and method for focal scanning of a specimen using optical projection tomographic microscopy and computer generation of three-dimensional images. One embodiment comprises a light source and an imaging system having an adjustable focal position which acquires a plurality of digital 2D projection images of biological tissue placed within a specimen tube that translates and rotates past an optical lens in a helical pattern. A computer captures the images and generates a 3D composite image. Also claimed is a system and method for preparing a specimen for optical microscopy. One embodiment comprises fixing, staining, and/or optically clearing biological tissue within a microfluidic specimen chamber prior to placement in a specimen tube.