The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Jan. 21, 2010
Marie Vans, Ft. Collins, CO (US);
Gidi Amir, Ness Ziona, IL;
Rodolfo Jodra, Boise, ID (US);
Omer Barkol, Haifa, IL;
Ram Dagan, Modiin, IL;
Avi Malki, Pethch Tikya, IL;
Carl Staelin, Haifa, IL;
Sagi Schein, Haifa, IL;
Mani Fischer, Haifa, IL;
Doron Shaked, Tivon, IL;
Steven J Simske, Fort Collins, CO (US);
Marie Vans, Ft. Collins, CO (US);
Gidi Amir, Ness Ziona, IL;
Rodolfo Jodra, Boise, ID (US);
Omer Barkol, Haifa, IL;
Ram Dagan, Modiin, IL;
Avi Malki, Pethch Tikya, IL;
Carl Staelin, Haifa, IL;
Sagi Schein, Haifa, IL;
Mani Fischer, Haifa, IL;
Doron Shaked, Tivon, IL;
Steven J Simske, Fort Collins, CO (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Automated inspection method for detecting a defect in a printed image, comprising processing a raster image, sending the raster image to a print process, printing a printed image corresponding to the raster image onto a medium, capturing a target image from at least a part of the printed image at a lower resolution than the printed image, at least in a medium moving direction, converting at least a part of the raster image to a reference image, and comparing the reference image to the target image.