The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8867372 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 21, 2014

Filed:

May. 02, 2012
Applicants:

Christian Volf Olgaard, Saratoga, CA (US);

Ruizu Wang, San Ramon, CA (US);

Erdem Serkan Erdogan, Sunnyvale, CA (US);

Mathew Philip, Palo Alto, CA (US);

Inventors:

Christian Volf Olgaard, Saratoga, CA (US);

Ruizu Wang, San Ramon, CA (US);

Erdem Serkan Erdogan, Sunnyvale, CA (US);

Mathew Philip, Palo Alto, CA (US);

Assignee:

Litepoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 12/26 (2013.01);
Abstract

The invention described herein utilizes devices under test (DUTs) outfitted with stored, predefined test sequences, testers equipped with vector-signal generation (VSG) and vector-signal analysis (VSA) functionality, and novel methods for combining loopback and single-ended test functions in order to obtain higher testing efficiency for DUTs using Bluetooth or other time-division duplex (TDD) based communications.


Find Patent Forward Citations

Olgaard, Christian. (2014). Method for efficient parallel testing of time division duplex (tdd) communications systems (U.S. Patent No. 8867372). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8867372

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…