The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Apr. 25, 2012
Applicants:
Naoki Kuwata, Nagano-ken, JP;
Yoshihiro Nakami, Nagano-ken, JP;
Inventors:
Naoki Kuwata, Nagano-ken, JP;
Yoshihiro Nakami, Nagano-ken, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01); H04N 1/38 (2006.01); G06F 9/40 (2006.01); G06K 9/00 (2006.01); H04N 1/407 (2006.01); H04N 19/17 (2014.01);
U.S. Cl.
CPC ...
G06K 9/00523 (2013.01); H04N 1/40062 (2013.01); H04N 1/4074 (2013.01); H04N 19/0026 (2013.01);
Abstract
A method for image processing image data having a plurality of picture elements. While scanning the image data, a scanned picture element is determined to be sampled or not according to a plurality of sampling methods until the scanned picture element is displaced to a next picture element (to be scanned) of the image data.