The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Oct. 26, 2012
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Thomas H. Jeys, Lexington, MA (US);

Antonio Sanchez-Rubio, Lexington, MA (US);

Ronald H. Hoffeld, Cambridge, MA (US);

Jonathan Z. Lin, Winchester, MA (US);

Nicholas M. F. Judson, Baltimore, MD (US);

George S. Haldeman, Melrose, MA (US);

Vincenzo Daneu, Woburn, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 11/00 (2006.01); G01N 21/53 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/53 (2013.01); G01B 11/002 (2013.01); G01N 2015/145 (2013.01); G01N 15/1459 (2013.01);
Abstract

A method and an apparatus of measuring a position of a particle in a flow are disclosed. An embodiment of the method comprises temporally modulating and spatially pattering an illumination beam propagating along a first dimension, passing a particle across the modulated illumination beam, detecting a temporal profile of scattered light produced by the particle's passing through the modulated illumination beam, and determining the position of the particle based, in part, on the temporal profile of the detected scattered light.


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