The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Sep. 07, 2009
Tetsuya Kawanishi, Tokyo, JP;
Akito Chiba, Tokyo, JP;
Junichiro Ichikawa, Tokyo, JP;
Masaaki Sudo, Tokyo, JP;
Tetsuya Kawanishi, Tokyo, JP;
Akito Chiba, Tokyo, JP;
Junichiro Ichikawa, Tokyo, JP;
Masaaki Sudo, Tokyo, JP;
National Institute of Information and Communications Technology, Tokyo, JP;
Sumitomo Osaka Cement Co., Ltd., Tokyo, JP;
Abstract
A method for evaluating a characteristic of, especially, each of Mach-Zehnder interferometers (MZIs) of an optical modulator. The method includes a step of measuring the intensity of the output of the optical modulator containing MZIs and a step of evaluating a characteristic of each MZI by using the sideband. The output intensity measuring step is the one of measuring the intensity Sof the sideband signal contained in the output light from the optical modulator. The characteristic evaluating step is the one of evaluating a characteristic of the MZIby using the S.