The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Nov. 21, 2012
The Johns Hopkins University, Baltimore, MD (US);
Chee Wei Wong, Weehawken, NJ (US);
Ying Li, New York, NY (US);
Jiangjun Zheng, New York, NY (US);
Daniel J. Rogers, Baltimore, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
An method and apparatus for measuring gravitational force are described where at least one first radiation can be provided to at least one optomechanical oscillator, the at least one optomechanical oscillator being structured to deform under the gravitational force to cause a shift in resonance associated with the at least one optomechanical oscillator. In addition, at least one second radiation is received from the at least one optomechanical oscillator, wherein the at least one second radiation is associated with the shift in the resonance, and the shift in the resonance can be determined based on the first and second radiations.