The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Sep. 26, 2013
Cypress Semiconductor Corporation, San Jose, CA (US);
Petro Ksondzyk, Mill Creek, WA (US);
Vasyl Mandziy, Lviv, UA;
Igor Kolych, Lviv, UA;
Massoud Badaye, Sunnyvale, CA (US);
Cypress Semiconductor Corporation, San Jose, CA (US);
Abstract
Techniques for correcting tail effect are described herein. In an example embodiment, a device comprises a sensor coupled with a processing logic. The sensor is configured to measure a plurality of measurements from a sensor array, where the measurements are representative of a conductive object that is in contact with or proximate to the sensor array. The sensor array comprises RX electrodes and TX electrodes that are interleaved without intersecting each other in a single layer on a substrate of the sensor array. The processing logic is configured to determine a set of adjustment values that correspond to a tail effect associated with the measurements, and to generate adjusted measurements based on the set of adjustment values, where the adjusted measurements correct a parasitic signal change of the tail effect.