The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Mar. 13, 2013
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Vasyl Mandziy, Lviv, UA;

Igor Kolych, Lviv, UA;

Volodymyr Hutnyk, Lviv, UA;

David G. Wright, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 27/26 (2006.01); G06F 3/041 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 27/2605 (2013.01); G01N 27/22 (2013.01); G06F 3/0418 (2013.01);
Abstract

Techniques for eliminating tail effect are described herein. In an example embodiment, a device comprises a sensor coupled with a processing logic. The sensor is configured to measure a plurality of measurements from a sensor array when the sensor array is in an unsettled state, where the measurements represent a conductive object that is proximate to a touch-sensing surface of the sensor array. The processing logic is configured to determine a set of adjustment values that correspond to a tail effect associated with the plurality of measurements, and to generate adjusted measurements corresponding to the plurality of measurements based on the set of adjustment values.


Find Patent Forward Citations

Loading…