The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

May. 13, 2009
Applicants:

Patrick Cabanis, Ozouer le Voulgis, FR;

Sandra Cheynet, Le Plessis Pate, FR;

Patrick Gaisnon, Cannes Ecluse, FR;

Luc Ravize, Bordes, FR;

Inventors:

Patrick Cabanis, Ozouer le Voulgis, FR;

Sandra Cheynet, Le Plessis Pate, FR;

Patrick Gaisnon, Cannes Ecluse, FR;

Luc Ravize, Bordes, FR;

Assignee:

SNECMA, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/904 (2013.01); G01N 27/9033 (2013.01);
Abstract

A probe for eddy current monitoring of the surface of a circumferential slot formed in a turbojet disk. The probe includes a stem fastened to a support and a first multi-element sensor constrained to move with the stem and configured to be inserted into the circumferential slot to perform the inspection, and a second multi-element sensor. The two multi-element sensors are disposed back to back, and the stem of the probe is mounted to pivot about its own axis to enable the two multi-element sensors to be inserted in the slot.


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